A.1 · Semiconductor & Silicon Architecture
Advanced Process Control (APC) Software for Fabs
Real-time inference across every tool in the fab
What we build
A distributed, real-time inference engine that ingests 10,000+ sensor data points per second from fab tools (etch, deposition, lithography). It runs multivariate statistical models and lightweight neural networks to detect equipment drift and outputs automated recipe adjustments (R2R) and predictive maintenance alerts.
Capabilities
- Distributed real-time ingestion of 10,000+ sensor points per second from etch, deposition, and lithography tools
- Multivariate statistical models and lightweight neural networks that detect equipment drift as it begins
- Automated run-to-run (R2R) recipe adjustments fed back to the tool
- Predictive maintenance alerts raised before a tool falls out of specification
Related services
How it connects
Where it sits in the stack.
This system, and the two it hands off to. None of them can be optimized alone.
Advanced Process Control
A distributed, real-time inference engine that ingests 10,000+ sensor data points per second from fab tools (etch, deposition, lithography).
EDA for Advanced Nodes
A suite of algorithms that convert RTL (Register-Transfer Level) code into a physical GDSII file ready for mask generation.
Semiconductor & Silicon · see serviceSerDes & Chip IP
Mixed-signal PHY IP blocks including PAM4/NRZ transceivers up to 224Gbps per lane, adaptive equalizers (FFE/DFE) for >40dB channel loss, clock-data recovery (CDR) circuits, and built-in self-test (BIST) for link health monitoring.
Semiconductor & Silicon · see serviceBring us the whole stack.
Tell us where latency is costing you, from the die to the data center to the control room. An architect replies with a first read of the problem, not a sales deck.